High Resolution FEG SEM

Jeol 7800-includes a secondary electron detector, a backscattered detector, and in-lens detectors. It includes a Deben STEM detector for imaging of ultrathin resin sections and negative staining of micron to nano-scale organisms and particles. It also includes an attached quorum PP3010T cryo-SEM apparatus and a ThermoFisher elemental analysis device. This instrument is used for micro to nano resolution samples of biological and material nature.