@article {Kenett1986-dx,
	title = {A Semi-Parametric Approach to Testing for Reliability Growth, with Application to Software Systems},
	journal = {IEEE Transactions on Reliability},
	volume = {35},
	number = {3},
	year = {1986},
	pages = {304{\textendash}311},
	publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
	author = {Kenett, Ron and Pollak, Moshe}
}
